• DocumentCode
    852835
  • Title

    Nonuniformity of electrical Characteristics in microstructures of ZnO surge varistors

  • Author

    He, Jinliang ; Zeng, Rong ; Chen, Qingheng ; Chen, Shuiming ; Guan, Zhicheng ; Han, Se-Won ; Cho, Han-Goo

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • Volume
    19
  • Issue
    1
  • fYear
    2004
  • Firstpage
    138
  • Lastpage
    144
  • Abstract
    The nonuniformity of electrical characteristics of grain boundaries in ZnO varistors was systematically analyzed. The high nonuniformity exists in barrier voltages and nonlinearity coefficients in different grain boundaries. The barrier voltages have normal distributions, only a few grain boundaries were electrically active, and the grain boundaries can be simply classified into good, bad, and ohmic ones according to the electrical characteristics of grain boundaries. The average barrier voltage is equal to 3.3 V by the direct method, but it is only 2.3 V by the indirect method. There is a high difference between the barrier voltages by direct and indirect measurement methods. These few good grain boundaries are responsible for the good varistor effect, and control the leakage current of ZnO varistor at low values of applied voltage. The Al2O3 dopants affect the electrical characteristics of grain boundaries by changing the electron status in grain boundary and intragrain.
  • Keywords
    electric current control; grain boundaries; leakage currents; normal distribution; surge protection; varistors; zinc compounds; 2.3 V; 3.3 V; Al2O3; ZnO; ZnO surge varistors microstructures; barrier voltages; dopants; electrical characteristics nonuniformity; grain boundaries; indirect measurement methods; leakage current; nonlinearity coefficients; Electric variables; Electrons; Gaussian distribution; Grain boundaries; Leakage current; Microstructure; Surges; Varistors; Voltage control; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2003.820214
  • Filename
    1256369