Title :
Laser link cutting for memory chip repair
Author_Institution :
Electro Sci. Industries Inc., Portland, OR, USA
fDate :
10/1/2002 12:00:00 AM
Abstract :
Link processing with individual laser pulses has become an industry standard process in IC memory chip manufacturing. It is gaining wide acceptance in analog chip reprogramming and tuning as well. Traditional laser processing, using the standard output of Nd:YAG at 1.064-μm and Nd:YLF at 1.047-μm laser wavelengths, works well for polysilicon links but is not satisfactory for metal links. This paper describes the physics modeling and computer simulation of the laser link process and a new technique of using 1.3-μm laser wavelength for the process. While light absorption of link materials at 1.064-, 1.047-, and 1.3-μm wavelengths are relatively the same, the absorption of a Si substrate at 1.3 μm is considerably less. The improved absorption contrast between the link material and silicon substrate at 1.3-μm delivers a much wider laser process window. Both simulation and experimental results are given and discussed. A brief introduction of another new technique, which uses UV laser pulses for link processing, is given. This UV laser process delivers a laser beam spot size much smaller than 1.5 μm.
Keywords :
integrated circuit manufacture; integrated circuit metallisation; integrated memory circuits; laser beam machining; light absorption; maintenance engineering; semiconductor process modelling; thermal stresses; 1.3 micron; IC memory chip manufacturing; Si; Si substrate; UV laser pulses; absorption contrast; analog chip reprogramming; computer simulation; individual laser pulses; laser beam spot size; laser link cutting; laser process window width; light absorption; mechanical stress simulation; memory chip repair; metal links; physics modeling; redundancy repair; Electromagnetic wave absorption; Laser beam cutting; Laser modes; Laser theory; Laser tuning; Manufacturing industries; Manufacturing processes; Optical materials; Optical pulses; Physics;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2002.803666