DocumentCode :
85304
Title :
Solution-Processed Barium Zirconate Titanate for Pentacene-Based Thin-Film Transistor and Memory
Author :
Adriyanto, Feri ; Chih-Kai Yang ; Tsung-Yu Yang ; Chia-Yu Wei ; Yeong-Her Wang
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
Volume :
34
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1241
Lastpage :
1243
Abstract :
Pentacene-based organic thin-film transistors with solution-processed barium zirconate titanate dielectric layers are demonstrated. According to the programming/erasing operations, the devices exhibited memory characteristics, such as reversible threshold voltage shifts and nondestructive readout. In addition, the reliability of the memory devices was confirmed by data retention time and repeated switching cycles´ endurance testing. In addition, the possible mechanism of the memory effect was also discussed. These results suggest that the devices could potentially be applied to nonvolatile memory applications in organic electronics.
Keywords :
barium compounds; dielectric devices; nondestructive readout; organic semiconductors; random-access storage; semiconductor device reliability; semiconductor device testing; thin film transistors; data retention time; dielectric layers; erasing operations; memory characteristics; memory devices reliability; memory effect; nondestructive readout; nonvolatile memory applications; organic electronics; pentacene-based organic thin-film transistors; programming operations; repeated switching cycles endurance testing; reversible threshold voltage shifts; solution-processed barium zirconate titanate; Barium; Dielectrics; Logic gates; Nonvolatile memory; Programming; Thin film transistors; Barium zirconate titanate (BZT); memory; organic thin-film transistors (OTFT); pentacene; solution-process;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2273365
Filename :
6581881
Link To Document :
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