Title :
Dynamic measurement in titanium thin-film resistors
Author :
Quinn, R.A. ; Kaiser, H.R.
Author_Institution :
Lockheed Missile and Space Co., Palo Alto, Calif.
fDate :
3/1/1963 12:00:00 AM
Abstract :
Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.
Keywords :
Aerospace engineering; Computational modeling; Electronics packaging; Refrigeration; Resistors; Reverberation; Thermal force; Titanium; Transistors; Welding;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1963.2188
