• DocumentCode
    853427
  • Title

    Dielectronic and Radiative Recombination of Highly Stripped Sulfur Ions Incident on Argon

  • Author

    Tanis, J.A. ; Shafroth, S.M. ; Clark, M. ; Swenson, J. ; Willis, J.E. ; Strait, E.N. ; Mowat, J.R.

  • Author_Institution
    Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
  • Volume
    28
  • Issue
    2
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    1063
  • Lastpage
    1065
  • Abstract
    We have measured sulfur K x-ray emission following electron capture for 70 MeV Sq+(q=13-16) ions incident on Ar. K radiation resulting from capture was isolated by detecting coincidences between S K x rays and electron capture events. Two recombination processes which result in the emission of a K x ray were identified: (1) dielectronic recombination, which is the inverse Auger effect and (2) radiative recombination, which results from capture into a high n state (n¿2). The cross section for K radiation following capture increases by more than three orders of magnitude for q = 13+ to 16+. The fraction of capture events which result in K radiation increases from 0.0004 for q = 13+ to 0.3 for q = 16+, indicating that radiative recombination becomes relatively more important for high charge states, i.e. as q ¿ Z. Possible applications to radiative loss processes in a plasma are discussed.
  • Keywords
    Argon; Electrons; Event detection; Laboratories; Physics; Plasma measurements; Projectiles; Radiative recombination; Radioactive decay; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4331341
  • Filename
    4331341