DocumentCode :
853427
Title :
Dielectronic and Radiative Recombination of Highly Stripped Sulfur Ions Incident on Argon
Author :
Tanis, J.A. ; Shafroth, S.M. ; Clark, M. ; Swenson, J. ; Willis, J.E. ; Strait, E.N. ; Mowat, J.R.
Author_Institution :
Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
Volume :
28
Issue :
2
fYear :
1981
fDate :
4/1/1981 12:00:00 AM
Firstpage :
1063
Lastpage :
1065
Abstract :
We have measured sulfur K x-ray emission following electron capture for 70 MeV Sq+(q=13-16) ions incident on Ar. K radiation resulting from capture was isolated by detecting coincidences between S K x rays and electron capture events. Two recombination processes which result in the emission of a K x ray were identified: (1) dielectronic recombination, which is the inverse Auger effect and (2) radiative recombination, which results from capture into a high n state (n¿2). The cross section for K radiation following capture increases by more than three orders of magnitude for q = 13+ to 16+. The fraction of capture events which result in K radiation increases from 0.0004 for q = 13+ to 0.3 for q = 16+, indicating that radiative recombination becomes relatively more important for high charge states, i.e. as q ¿ Z. Possible applications to radiative loss processes in a plasma are discussed.
Keywords :
Argon; Electrons; Event detection; Laboratories; Physics; Plasma measurements; Projectiles; Radiative recombination; Radioactive decay; Spontaneous emission;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1981.4331341
Filename :
4331341
Link To Document :
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