Title : 
Evaluating the influence of post-mould cure and additives on the viscoelastic properties of a low stress epoxy mould compound
         
        
            Author : 
Chew, Spencer ; Tan, Ah-Chin
         
        
            Author_Institution : 
Hewlett-Packard Singapore Ltd., Singapore
         
        
        
        
        
            fDate : 
7/1/2003 12:00:00 AM
         
        
        
        
            Abstract : 
This work investigates the influence of post mould cure (PMC) duration on the viscoelastic properties of a low stress, epoxy mould compound. Results show glass transition increases while modulus measured at room temperature decreases with increasing PMC duration. Glass transition typically increases with increasing PMC as cross-linking density increases. Modulus is not expected to decrease with increased cross-link density. It is postulated that progressive attachment of silicone particles to the cross-link network of the encapsulant is active during PMC. The net effect of the attachment of silicone particles to the cross-linked network and increased cross-link density as a result of residual cure is a decrease in modulus with increasing post mould cure.
         
        
            Keywords : 
additives; curing; elastic moduli; encapsulation; filled polymers; glass transition; integrated circuit packaging; plastic packaging; thermal management (packaging); transfer moulding; viscoelasticity; IC encapsulation; additives influence; crosslinking density; flexural modulus; glass transition; large CTE mismatch; low stress epoxy mould compound; moisture soaking; multifunctional composite; plastic packages; post mould cure duration; pressure cooker test; progressive attachment; residual cure; silicone particles; storage modulus; thermal stresses; transfer-moulding; viscoelastic properties; Additives; Elasticity; Electronic packaging thermal management; Epoxy resins; Glass; Silicon compounds; Temperature; Thermal expansion; Thermal stresses; Viscosity;
         
        
        
            Journal_Title : 
Electronics Packaging Manufacturing, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TEPM.2003.820803