DocumentCode :
853659
Title :
Warpage in plastic packages: effects of process conditions, geometry and materials
Author :
Kong, Janet W Y ; Kim, Jang-Kyo ; Yuen, Matthew M F
Author_Institution :
ASAT Ltd., Hong Kong, China
Volume :
26
Issue :
3
fYear :
2003
fDate :
7/1/2003 12:00:00 AM
Firstpage :
245
Lastpage :
252
Abstract :
The effects of several important parameters, including processing conditions, package geometry and materials, are specifically studied on the occurrence of warpage and coplanarity for a plastic package. Special emphasis is placed on the evaluation of moulding compound properties and optimal processing conditions that can effectively minimize warpage. It is found that moulding compounds requiring a low moulding temperature and having a low coefficient of thermal expansion (CTE) can significantly reduce warpage. The elastic modulus was found to be inversely proportional to warpage, indicating the modulus should be kept as high as possible. The post-mould curing is essential to reducing warpage as it increases the glass transition temperature, but lowers the thermal shrinkage. A cross-shaped die paddle against a full square paddle, a thick die attach and a large die size are also favorable to reducing warpage.
Keywords :
curing; glass transition; optimised production technology; plastic packaging; shrinkage; thermal management (packaging); thermal stresses; transfer moulding; coplanarity; cross-shaped die paddle; elastic modulus; fish-bone diagram; full square paddle; glass transition temperature; low coefficient of thermal expansion; moulding compounds; optimization; package geometry; package materials; plastic package; post-mould curing; processing conditions; thermal shrinkage; thin quad flat pack; warpage; Curing; Electronic packaging thermal management; Electronics packaging; Geometry; Glass; Materials science and technology; Plastic packaging; Residual stresses; Temperature; Thermal expansion;
fLanguage :
English
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-334X
Type :
jour
DOI :
10.1109/TEPM.2003.820806
Filename :
1256729
Link To Document :
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