Title :
Finite element electro-thermal modelling of nanocrystalline phase change elements using mesh-based crystallinity approach
Author :
Trombetta, M. ; Williams, Nicholas E. ; Fischer, Shannon ; Gokirmak, Ali ; Silva, Hugo
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
Abstract :
Phase change memory cells composed of nanocrystalline Ge2Sb2Te5 with a heater diameter of 10 nm and Ge2Sb2Te5 thickness of 100 nm are studied by using two-dimensional finite element simulations with COMSOL Multiphysics. The nanocrystalline Ge2Sb2Te5 is emulated by using a mesh-based model incorporating crystalline grains of random size and location embedded in the amorphous media. The material parameters are modelled with temperature dependency from 300 to 1000 K, including electrical resistivity, thermal conductivity, electric field breakdown and Seebeck coefficient. This model is shown to capture the cycle-to-cycle and device-to-device variability in phase change memory cells.
Keywords :
Seebeck effect; antimony compounds; chalcogenide glasses; electric breakdown; electrical resistivity; germanium compounds; mesh generation; nanostructured materials; phase change materials; phase change memories; thermal conductivity; COMSOL multiphysics; Ge2Sb2Te5; Seebeck coefficient; amorphous media; crystalline grains; cycle-to-cycle variability; device-to-device variability; electric field breakdown; electrical resistivity; finite element electrothermal modelling; material parameters; mesh-based crystallinity approach; nanocrystalline phase change elements; phase change memory cells; random size; size 10 nm; size 100 nm; temperature 300 K to 1000 K; thermal conductivity; two-dimensional finite element simulations;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2013.2253