Title :
PIXE as an Analytical Tool: An External-Beam System in Helium and the Role of Sample Preparation
Author :
Williams, Evan T. ; Finston, Harmon L.
Author_Institution :
Department of Chemistry, City University of New York Brooklyn College Brooklyn, New York, 11210
fDate :
4/1/1981 12:00:00 AM
Abstract :
A PIXE system in which samples in a helium-filled target chamber are irradiated by an external proton beam is described. The system is well suited for study of a wide range of materials, some merely calling for qualitative analysis, and others requiring quantitative measurements. This variety mandates a flexible approach to sample preparation in order to obtain full sensitivity of the system. Some examples taken from our work are given.
Keywords :
Atmosphere; Chemistry; Educational institutions; Helium; Ion beams; Particle beams; Protons; Structural beams; X-ray detection; X-ray detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4331421
