Title :
An alignment insensitive separable electromagnetic coupler for high-speed digital multidrop bus applications
Author :
Benham, John R. ; Amirtharajah, Rajeevan ; Critchlow, John L. ; Simon, Thomas ; Knight, Thomas F., Jr.
Author_Institution :
Intel Corp., Hudson, MA, USA
Abstract :
A separable electromagnetic coupler was designed, simulated, fabricated, and tested as part of a prototype eight-module multidrop memory bus. The coupler consists of broadside coupled traces, one on a rigid motherboard and the other on a flex circuit soldered to a daughter card. The zig-zag geometry of the traces reduces variation in the coupling coefficient due to horizontal and vertical misalignment of the coupler halves. Simulation and testing indicates that a target capacitive coupling coefficient of 0.34, which has been selected to balance signal-transmission-level requirements against motherboard impedance discontinuity effects, can be achieved with little variation over +/-12-mil alignment tolerance. In addition, custom interface circuitry was designed in conjunction with the coupler to enable 1.6-Gb/s data rate per differential pair. The prototype system was tested for an extended period executing read and write memory transactions for an estimated bit error rate less than 2.0e-17.
Keywords :
CMOS digital integrated circuits; S-parameters; electromagnetic coupling; high-speed integrated circuits; intersymbol interference; microstrip lines; printed circuit accessories; prototypes; system buses; alignment insensitive separable electromagnetic coupler design; alignment tolerance; balance signal-transmission-level; broadside coupled traces; custom interface circuitry; daughter card; flex circuit soldering; high-speed digital multidrop bus; horizontal misalignment; insensitive separable electromagnetic coupler; motherboard impedance discontinuity effects; prototype eight-module multidrop memory bus; prototype system; read memory transactions; rigid motherboard; target capacitive coupling coefficient; vertical misalignment; write memory transactions; zig-zag geometry; Circuit simulation; Circuit testing; Coupling circuits; Electromagnetic coupling; Flexible electronics; Geometry; Impedance; Prototypes; System testing; Virtual prototyping;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.819768