• DocumentCode
    854596
  • Title

    Electromechanical coupling correction for piezoelectric layered beams

  • Author

    Tadmor, Ellad B. ; Kósa, Gábor

  • Author_Institution
    Dept. of Mech. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    12
  • Issue
    6
  • fYear
    2003
  • Firstpage
    899
  • Lastpage
    906
  • Abstract
    This paper deals with the bending of layered piezoelectric beams (multimorphs) subjected to arbitrary electrical and mechanical loading. Weinberg (1999) obtained a closed-form solution to this problem using Euler-Bernoulli beam theory and integrated equilibrium equations. In his analysis, Weinberg assumes that the electric field is constant through the thickness of the piezoelectric layers. This approximation is valid for materials with small electromechanical coupling (EMC) coefficients. In this paper, we relax this constraint and obtain a solution which accounts for the effect of strain on the electric field in the layers. We find that Weinberg´s solution can be extended to arbitrary EMC with a simple correction to the moment of inertia I of the piezoelectric layers. The EMC correction amounts to replacing I with (1+ξ)I, where ξ is the square of the expedient coupling coefficient. The error in beam curvature introduced by neglecting the effect of EMC is shown to be proportional to ξ. This effect can be quite significant for modern piezoelectric materials which tend to have large EMC coefficients. The formulation is applied to three example cases: a cantilever unimorph, an asymmetric bimorph and a three-layer multimorph with an elastic core. The theoretical predictions for the last two examples are compared to simulations using the finite-element method (FEM) and found to be in excellent agreement.
  • Keywords
    beams (structures); bending; finite element analysis; piezoelectric actuators; piezoelectric materials; stress-strain relations; Euler-Bernoulli beam theory; arbitrary electrical loading; arbitrary mechanical loading; asymmetric bimorph; beam curvature error; bending; cantilever unimorph; closed-form solution; elastic core; electromechanical coupling correction; finite-element method; integrated equilibrium equations; layered piezoelectric beams; moment of inertia; multimorphs; piezoelectric actuators; proportionality factors; three-dimensional constitutive relation; three-layer multimorph; Anisotropic magnetoresistance; Associate members; Capacitive sensors; Closed-form solution; Conducting materials; Electromagnetic compatibility; Finite element methods; Optical coupling; Piezoelectric materials; Predictive models;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2003.820286
  • Filename
    1257370