DocumentCode
854596
Title
Electromechanical coupling correction for piezoelectric layered beams
Author
Tadmor, Ellad B. ; Kósa, Gábor
Author_Institution
Dept. of Mech. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume
12
Issue
6
fYear
2003
Firstpage
899
Lastpage
906
Abstract
This paper deals with the bending of layered piezoelectric beams (multimorphs) subjected to arbitrary electrical and mechanical loading. Weinberg (1999) obtained a closed-form solution to this problem using Euler-Bernoulli beam theory and integrated equilibrium equations. In his analysis, Weinberg assumes that the electric field is constant through the thickness of the piezoelectric layers. This approximation is valid for materials with small electromechanical coupling (EMC) coefficients. In this paper, we relax this constraint and obtain a solution which accounts for the effect of strain on the electric field in the layers. We find that Weinberg´s solution can be extended to arbitrary EMC with a simple correction to the moment of inertia I of the piezoelectric layers. The EMC correction amounts to replacing I with (1+ξ)I, where ξ is the square of the expedient coupling coefficient. The error in beam curvature introduced by neglecting the effect of EMC is shown to be proportional to ξ. This effect can be quite significant for modern piezoelectric materials which tend to have large EMC coefficients. The formulation is applied to three example cases: a cantilever unimorph, an asymmetric bimorph and a three-layer multimorph with an elastic core. The theoretical predictions for the last two examples are compared to simulations using the finite-element method (FEM) and found to be in excellent agreement.
Keywords
beams (structures); bending; finite element analysis; piezoelectric actuators; piezoelectric materials; stress-strain relations; Euler-Bernoulli beam theory; arbitrary electrical loading; arbitrary mechanical loading; asymmetric bimorph; beam curvature error; bending; cantilever unimorph; closed-form solution; elastic core; electromechanical coupling correction; finite-element method; integrated equilibrium equations; layered piezoelectric beams; moment of inertia; multimorphs; piezoelectric actuators; proportionality factors; three-dimensional constitutive relation; three-layer multimorph; Anisotropic magnetoresistance; Associate members; Capacitive sensors; Closed-form solution; Conducting materials; Electromagnetic compatibility; Finite element methods; Optical coupling; Piezoelectric materials; Predictive models;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2003.820286
Filename
1257370
Link To Document