An examination of transition noise by Lorentz electron microscopy recording media

Author

Ferrier, R.P. ; Martin, F.J. ; Arnoldussen, T.C. ; Nunnelley, L.L.

Author_Institution

Dept. of Phys. & Astron., Glasgow Univ., UK

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

1536

Lastpage

1538

Abstract

The authors discuss recent results of a program, based on Lorentz electron microscopy, which has as its aim the development of quantitative methods to relate the micromagnetic structure of a thin-film recording medium to its recording performance and in particular the noise characteristic. An approach where the noise associated with individual flux reversals is considered and analyzed in terms of two components, transition noise and transition shift noise, is described. It is shown that this method gives a deeper insight into the relationship between micromagnetic structure and noise

Keywords

electron microscopy; magnetic recording; magnetic thin films; magnetisation reversal; random noise; Lorentz electron microscopy; individual flux reversals; micromagnetic structure; noise characteristic; quantitative methods; recording media; recording performance; thin-film recording medium; transition noise; transition shift noise; Digital magnetic recording; Disk recording; Electron microscopy; Magnetic analysis; Magnetic anisotropy; Magnetic noise; Magnetization; Micromagnetics; Signal analysis; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104437

Filename

104437