DocumentCode

854825

Title

Epitaxial FET cutoff voltage

Author

Warner, R.M.

Volume

51

Issue

6

fYear

1963

fDate

6/1/1963 12:00:00 AM

Firstpage

939

Lastpage

940

Keywords

Electrical resistance measurement; Epitaxial growth; FETs; Geometry; Impurities; Ionization; Temperature; Testing; Thickness measurement; Voltage;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1963.2337

Filename

1444267