Title :
Polarization Switching Regions of Optically Injected Long-Wavelength VCSELs
Author :
Quirce, Ana ; Perez, Pablo ; Hong Lin ; Valle, Angel ; Pesquera, Luis ; Panajotov, K. ; Thienpont, Hugo
Author_Institution :
Fac. of Eng. Sci., Vrije Univ. Brussel, Brussels, Belgium
Abstract :
We report on an experimental study of the injected optical power required for polarization switching (PS) in a vertical-cavity surface-emitting laser (VCSEL) subject to orthogonal optical injection. This power is found as a function of the frequency detuning between the injected light and suppressed linear polarization of the solitary VCSEL. Increasing the injected power, we found two types of PS when injecting light with wavelength close to the wavelength of the suppressed linear polarization and to that of the linear polarization of the solitary VCSEL. These two types of PS are, respectively: 1) single and double (with two minima of injected power necessary for PS) and 2) double PS (with two islands of PS and a separate region with a single minimum of injected power). Our experimental results confirm the theoretical predictions of Torre et al. Double PS is observed around the elliptically polarized injection locked states found by Lin et al. Different dynamics are found in the route to PS.
Keywords :
laser cavity resonators; light polarisation; optical switches; semiconductor lasers; surface emitting lasers; elliptically polarized injection locked states; frequency detuning; optically injected long-wavelength VCSEL; orthogonal optical injection; polarization switching regions; solitary VCSEL; suppressed linear polarization; vertical cavity surface emitting laser; Optical attenuators; Optical fibers; Optical polarization; Optical reflection; Optical switches; Stimulated emission; Vertical cavity surface emitting lasers; Polarization switching; Vertical-cavity surface-emitting lasers (VCSELs); non-linear dynamics; orthogonal optical injection; vertical-cavity surface-emitting lasers (VCSELs);
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2014.2360236