DocumentCode :
855067
Title :
Instrumenting embedded test software in support system integration, factory production, and depot repair
Author :
Vash, John R.
Author_Institution :
Raytheon Syst. Co., McKinney, TX, USA
Volume :
17
Issue :
10
fYear :
2002
fDate :
10/1/2002 12:00:00 AM
Firstpage :
19
Lastpage :
22
Abstract :
Embedded built-in test (BIT) software typically provides a system-level go/no-go indication and, in the presence of a failure, may provide some level of sub-system isolation. This level of reporting, while meeting the customer\´s operational requirements, does little to support system integration, production, and repair. To support these other needs, "instrumentation code" is added to the BIT software to provide detailed test data through an external interface. Since the BIT software already accesses the hardware parameters for testing, it becomes the most logical component for the instrumentation. This paper describes the techniques of embedding instrumentation during BIT design and development to support a broad range of program test needs. It explains the costs and benefits associated with the use of instrumentation. It gives specific examples of instrumented software and describes how instrumentation data can be used during environmental tests, factory test, and depot test. The impact instrumentation has on software development time, code size, execution time, and reliability is discussed as well as the cost of retrofitting BIT software to add instrumentation. Some of the benefits as well as the challenges to developing effective embedded instrumentation is also examined.
Keywords :
built-in self test; computerised instrumentation; cost-benefit analysis; embedded systems; environmental testing; code size; depot repair; depot test; embedded built-in test software; environmental tests; execution time; external interface; factory test; hardware parameters; instrumentation embedding; instrumented software; reliability; software development time; system integration support; Built-in self-test; Embedded software; Hardware; Instruments; Logic testing; Production facilities; Production systems; Software systems; Software testing; System testing;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/MAES.2002.1044512
Filename :
1044512
Link To Document :
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