DocumentCode :
855181
Title :
Application of subspace projection approaches for reduced-order modeling of electromagnetic systems
Author :
Zhou, Tingdong ; Dvorak, Steven L. ; Prince, John L.
Author_Institution :
Enterprise Syst. Group, IBM Corp., Poughkeepsie, NY, USA
Volume :
26
Issue :
4
fYear :
2003
Firstpage :
353
Lastpage :
360
Abstract :
Subspace projection approaches, including the Pade´ via Lanczos (PVL), Krylov, and rational Krylov algorithms, are used for reduced-order modeling of wide-band electromagnetic systems. The properties of these algorithms are discussed. A frequency segmentation technique has also been used with the Lanczos algorithm to obtain benchmark data of electromagnetic fields and for scattering parameter extraction from the calculated electromagnetic field values. From the various techniques, the combined PVL/frequency segmentation technique is the most promising for efficient and accurate modeling of electromagnetic systems.
Keywords :
Maxwell equations; S-parameters; computational electromagnetics; electromagnetic fields; finite difference methods; frequency-domain analysis; iterative methods; linear systems; matrix decomposition; rational functions; reduced order systems; state-space methods; waveguide discontinuities; waveguide theory; Maxwell´s curl equations; Pade approximations; Pade via Lanczos algorithm; dielectric discontinuity; electromagnetic discontinuity solver; electromagnetic fields; frequency domain finite difference method; frequency segmentation technique; parallel-plate waveguide; perfectly matched layers; rational Krylov algorithm; reduced-order modeling; scattering parameter; state-space representation; subspace projection approaches; wide-band electromagnetic system; Electromagnetic fields; Electromagnetic modeling; Frequency; Integrated circuit interconnections; Integrated circuit packaging; Linear systems; Power system interconnection; Power system modeling; Scattering parameters; Wideband;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2003.821072
Filename :
1257429
Link To Document :
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