DocumentCode
855328
Title
Terahertz detection by GaN/AlGaN transistors
Author
Fatimy, A.E. ; Tombet, S. Boubanga ; Teppe, F. ; Knap, W. ; Veksler, D.B. ; Rumyantsev, S. ; Shur, M.S. ; Pala, N. ; Gaska, R. ; Fareed, Q. ; Hu, X. ; Seliuta, D. ; Valusis, G. ; Gaquiere, C. ; Theron, D. ; Cappy, A.
Author_Institution
GES CNRS-Univ., Montpellier
Volume
42
Issue
23
fYear
2006
Firstpage
1342
Lastpage
1343
Abstract
Detection of subterahertz and terahertz radiation by high electron mobility GaN/AlGaN transistors in the 0.2-2.5 THz frequency range (much higher than the cutoff frequency of the transistors) is reported. Experiments were performed in the temperature range 4-300 K. For the lowest temperatures, a resonant response was observed. The resonances were interpreted as plasma wave excitations in gated two-dimensional electron gas. Non-resonant detection was observed at temperatures above 100 K. Estimates for noise equivalent power show that these transistors can be used as efficient detectors of terahertz radiation at cryogenic and room temperatures
Keywords
III-V semiconductors; aluminium compounds; electron gas; gallium compounds; high electron mobility transistors; plasma waves; submillimetre wave measurement; wide band gap semiconductors; 0.2 to 2.5 THz; 2D electron gas; 4 to 300 K; GaN-AlGaN; cryogenic temperatures; high electron mobility transistors; nonresonant detection; plasma wave excitations; resonant response; room temperatures; terahertz radiation detection;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20062452
Filename
4027818
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