• DocumentCode
    855328
  • Title

    Terahertz detection by GaN/AlGaN transistors

  • Author

    Fatimy, A.E. ; Tombet, S. Boubanga ; Teppe, F. ; Knap, W. ; Veksler, D.B. ; Rumyantsev, S. ; Shur, M.S. ; Pala, N. ; Gaska, R. ; Fareed, Q. ; Hu, X. ; Seliuta, D. ; Valusis, G. ; Gaquiere, C. ; Theron, D. ; Cappy, A.

  • Author_Institution
    GES CNRS-Univ., Montpellier
  • Volume
    42
  • Issue
    23
  • fYear
    2006
  • Firstpage
    1342
  • Lastpage
    1343
  • Abstract
    Detection of subterahertz and terahertz radiation by high electron mobility GaN/AlGaN transistors in the 0.2-2.5 THz frequency range (much higher than the cutoff frequency of the transistors) is reported. Experiments were performed in the temperature range 4-300 K. For the lowest temperatures, a resonant response was observed. The resonances were interpreted as plasma wave excitations in gated two-dimensional electron gas. Non-resonant detection was observed at temperatures above 100 K. Estimates for noise equivalent power show that these transistors can be used as efficient detectors of terahertz radiation at cryogenic and room temperatures
  • Keywords
    III-V semiconductors; aluminium compounds; electron gas; gallium compounds; high electron mobility transistors; plasma waves; submillimetre wave measurement; wide band gap semiconductors; 0.2 to 2.5 THz; 2D electron gas; 4 to 300 K; GaN-AlGaN; cryogenic temperatures; high electron mobility transistors; nonresonant detection; plasma wave excitations; resonant response; room temperatures; terahertz radiation detection;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20062452
  • Filename
    4027818