Title :
An assessment of change in stress due to cross-sectioning in moire´ interferometric characterization of electronic packages
Author :
Ratanawilai, Thanate B. ; Subbarayan, Ganesh
Author_Institution :
Dept. of Mech. Eng., Univ. of Colorado, Boulder, CO, USA
Abstract :
Cross-sectional moire´ interferometry technique is a very commonly applied one for the characterization of electronic packages. While the technique is popular, its use has not been accompanied by rigorous evaluation of its measurement accuracy. Such an evaluation, necessary because the cross-sectioning destructively modifies the original geometry, is the goal of the current paper. In the present study, a five-layer specimen with intact axi-symmetry as well as one in which the symmetry is destroyed through cross-sectioning are chosen as the vehicles for developing an understanding of the effect of cross-sectioning. We present a rigorous validation of an analytical elasticity model of axi-symmetric package-like structures in which the model prediction is shown to be accurate to within 1% of experimental measurement. The validated analytical model is used to estimate a reduction in radial stress of approximately 40% due to the cross-sectioning of the circular specimens, while the radial strains were virtually unaffected by cross-sectioning. These results suggest that cross-sectional moire´ interferometry is likely to yield accurate strains, but not stresses. Since damage under cyclic loading is a function of both stress and strain, the use of moire´ interferometry for studying the evolution of strains in packages under cyclic loading is likely to be grossly in error.
Keywords :
electronics packaging; light interferometry; moire fringes; strain measurement; stress measurement; thermal stresses; analytical elasticity model; axisymmetric package-like structures; circular specimens; cross-sectional Moire interferometry; electronic packages; five-layer specimen; measurement accuracy; radial strains; radial stress reduction; thermal stress; Analytical models; Capacitive sensors; Electronic packaging thermal management; Electronics packaging; Interferometry; Plastic packaging; Predictive models; Soldering; Thermal expansion; Thermal stresses;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2003.821679