• DocumentCode
    855596
  • Title

    Improvement of magnetic properties and crystallinity of Co-Cr/Ni-Fe double-layer with very thin Co79Cr21 underlayer

  • Author

    Nakagawa, S. ; Akiyama, S. ; Sumide, M. ; Naoe, M.

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1608
  • Lastpage
    1610
  • Abstract
    A three-step sputtering system for improving the crystallinity of the Ni-Fe backlayer and the c-axis orientation of the Co-Cr recording layer in double-layered perpendicular magnetic recording media is presented. It is found that the Co79Cr21 ultrathin underlayer with a thickness of only 100 Å was useful for improving the crystallinity of Ni-Fe backlayers without change of their soft magnetism. The Ni81Fe19 layer grew on the underlayer heteroepitaxially and, in addition, exhibited good orientation of the (111) plane. Such a special underlayer could directly improve the crystallinity of the Ni81Fe19 backlayer and indirectly improve the c-axis orientation for a Co83Cr17 recording layer through the backlayers, leading to sufficient perpendicular magnetic anisotropy in the triple-layered films
  • Keywords
    chromium alloys; cobalt alloys; crystal orientation; iron alloys; magnetic anisotropy; magnetic recording; magnetic thin films; nickel alloys; sputtered coatings; Co79Cr21 ultrathin underlayer; Co83Cr17 recording layer; Ni81Fe19 backlayer; NiFe-CoCr; c-axis orientation; crystallinity; double-layered perpendicular magnetic recording media; magnetic properties; perpendicular magnetic anisotropy; soft magnetism; three-step sputtering system; triple-layered films; Chromium; Crystallization; Iron; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Soft magnetic materials; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104463
  • Filename
    104463