Title :
Very thin CoCr films on titanium underlayers for high-density perpendicular recording computer discs
Author :
Mapps, D.J. ; Akhter, M.A. ; Pan, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Plymouth, UK
fDate :
9/1/1990 12:00:00 AM
Abstract :
Very thin CoCr films with and without a Ti underlayer were deposited on strengthened glass disk substrates by bias RF-sputtering. Perpendicular M-H loops were successfully measured by a polar Kerr M-O loop plotter. Very pronounced effects of the Ti underlayer and bias on the shearing of the loop and the perpendicular remanence ratio were observed. X-ray diffraction results show excellent (002) orientation of CoCr films with Ti underlayers. Experimental results are discussed in the light of the particulate model and the stripe domain model
Keywords :
Kerr magneto-optical effect; X-ray diffraction examination of materials; chromium alloys; cobalt alloys; magnetic disc storage; magnetic hysteresis; magnetic recording; magnetic thin films; sputtered coatings; titanium; (002) orientation; CoCr-Ti; M-H loops; Ti underlayer; X-ray diffraction; bias RF-sputtering; high-density perpendicular recording computer discs; particulate model; perpendicular remanence ratio; polar Kerr M-O loop plotter; strengthened glass disk substrates; stripe domain model; thin CoCr films; Coercive force; Glass; Magnetic films; Optical films; Perpendicular magnetic recording; Reflection; Remanence; Shearing; Skin; Titanium;
Journal_Title :
Magnetics, IEEE Transactions on
