DocumentCode
855954
Title
Measuring the impact of microarchitectural ideas
Author
Bose, Pradip
Author_Institution
IBM Corp.
Volume
26
Issue
1
fYear
2006
Firstpage
5
Lastpage
6
Abstract
Welcome to IEEE Micro’s first issue of 2006. We are starting this year with our annual Top Picks issue. This is the third such annual collection of magazine-style adaptations of our top-rated papers selected from the past year’s computer architecture and design conferences.
Keywords
IEEE Micro; Top Picks; microarchitecture; CMOS technology; Collaboration; Computer architecture; Delay; Microarchitecture; Microprocessor chips; Process design; Research and development; Semiconductor device measurement; System testing; IEEE Micro; Top Picks; microarchitecture;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2006.19
Filename
1603489
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