Title :
Performance analysis of an ADC histogram test using small triangular waves
Author :
Alegria, Francisco ; Arpaia, Pasquale ; Da Cruz Serra, António M. ; Daponte, Pasquale
Author_Institution :
Instituto Superior Tecnico, Lisbon, Portugal
fDate :
8/1/2002 12:00:00 AM
Abstract :
The histogram method using small-amplitude triangular waves for the quasi-static test of analog-to-digital converters has been proposed for standardization aims. In this paper, after a brief description of the test procedure, analytical closed-form relations for designing the test, as well as for its characterization in terms of efficiency and uncertainty, are provided. Numerical and experimental results of a comparative analysis with the IEEE 1057-standard static test highlight its better performance in terms of efficiency and accuracy.
Keywords :
analogue-digital conversion; graphs; integrated circuit testing; measurement uncertainty; phase noise; signal sampling; standardisation; waveform generators; ADC histogram method; analog-to-digital converters; analytical closed-form relations; efficiency; input equivalent noise; linearity distortion; number of bits; performance analysis; phase noise; quasi-static test; small-amplitude triangular waves; standardization; static test; uncertainty; Analog-digital conversion; Code standards; Distortion; Histograms; Linearity; Performance analysis; Signal generators; Standardization; Testing; Uncertainty;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.803292
