Title :
Microstrip conductor losses calculated by full wave and perturbational approaches
Author_Institution :
Naval Res. Lab., Washington, DC
fDate :
4/28/1988 12:00:00 AM
Abstract :
Losses due to ohmic conductor scattering mechanisms are incorporated into two different approaches, one using a skin effect perturbational method and the other using a full wave dyadic modification technique. Numerical results are compared for 1-20 GHz
Keywords :
losses; strip lines; 1 to 20 GHz; dyadic modification technique; full wave; ohmic conductor scattering mechanisms; perturbational approaches; skin effect;
Journal_Title :
Electronics Letters
