Title :
A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs
Author :
Monteiro, Conceição Líbano ; Arpaia, Pasquale ; Serra, António Cruz
Author_Institution :
Dept. of Electr. & Comput. Eng., Tech. Univ. of Lisbon, Portugal
fDate :
8/1/2002 12:00:00 AM
Abstract :
A phase-spectrum-based approach to the dynamic characterization of hysteretic analog-to-digital converters is proposed. Analytical relations between hysteresis of the dynamic transfer characteristic and out-of-phase components of the output Fourier spectrum are given. On this basis, an error model, a figure of merit, and a procedure for dynamic hysteresis testing are presented. Results of numerical characterization and experimental validation tests highlight the practical effectiveness of the proposed approach and its suitability for standardization.
Keywords :
Fourier series; analogue-digital conversion; harmonic distortion; hysteresis; integrated circuit testing; signal sampling; spectral analysis; transfer functions; dynamic characterization; dynamic hysteresis testing; dynamic transfer characteristic; error model; figure of merit; hysteretic ADC; ideal transfer characteristic; metrological characterization; out-of-phase components; output Fourier spectrum; phase-spectrum-based approach; pipelined-flash digitizer; standardization; Analog-digital conversion; Histograms; Hysteresis; Impedance matching; Instruments; Proposals; Standardization; Standards; Testing; Transfer functions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.803303
