Title :
Opportunistic Transient-Fault Detection
Author :
Gomaa, Mohamed A. ; Vijaykumar, T.N.
Author_Institution :
Purdue Univ., West Lafayette, IN
Abstract :
CMOS scaling continues to enable faster transistors and lower supply voltage, improving microprocessor performance and reducing per-transistor power. The downside of scaling is increased susceptibility to soft errors due to strikes by cosmic particles and radiation from packaging materials. The result is degraded reliability in future commodity microprocessors. The authors target better coverage while incurring minimal performance degradation by opportunistically using redundancy
Keywords :
fault diagnosis; microprocessor chips; performance evaluation; power consumption; redundancy; CMOS scaling; microprocessor performance; minimal performance degradation; opportunistic transient-fault detection; per-transistor power reduction; redundancy; Computer errors; Costs; Degradation; Fault tolerant systems; Microprocessors; Power generation; Redundancy; Space missions; Voltage; Yarn; CMOS scaling; Transient-fault detection; redundancy; soft errors;
Journal_Title :
Micro, IEEE
