DocumentCode :
856326
Title :
Statistical efficiency of the ADC sinewave histogram test
Author :
Carbone, Paolo ; Nunzi, Emilia ; Petri, Dario
Author_Institution :
Dipt. di Ingegneria Elettronica e dell´´Informazione, Perugia Univ., Italy
Volume :
51
Issue :
4
fYear :
2002
fDate :
8/1/2002 12:00:00 AM
Firstpage :
849
Lastpage :
852
Abstract :
This paper presents an analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter. Accordingly, at first, a closed-form determination of the Cramer-Rao bound is derived under the assumption of a noiseless stimulus signal. Both unbiased and biased versions of the bound are described in order to account for the eventual bias introduced by commonly employed estimators. Then, additive Gaussian noise is assumed, and comments are made about its effects on the maximum achievable accuracy.
Keywords :
AWGN; analogue-digital conversion; graphs; higher order statistics; integrated circuit testing; signal sampling; waveform generators; ADC sinewave histogram test; Cramer-Rao bound; additive Gaussian noise; closed-form determination; code density test; cumulative histogram; input-output characteristic; multibit quantizer; noiseless stimulus signal; statistical efficiency; unknown transition levels; Additive noise; Analog-digital conversion; Frequency domain analysis; Gaussian noise; Helium; Histograms; Linearity; Sampling methods; Signal processing; Testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2002.803506
Filename :
1044772
Link To Document :
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