Title :
Fault diagnosis of analog piecewise linear circuits based on homotopy
Author :
Robotycki, Artur ; Zielonko, Romuald
Author_Institution :
Atena Financial & Informatics Services Ltd., Sopot, Poland
fDate :
8/1/2002 12:00:00 AM
Abstract :
This paper deals with a verification method of diagnosis of analog piecewise linear circuits based on the homotopy approach. Homotopy maps one function f(x) into another g(x) by changing the homotopic parameter t∈[0, 1]. The homotopic path shows the passing way of some point x0 from the function domain f(x) to an appropriate point x* of the function g(x). The idea of the method relies on the application of function f(x) to the description of a circuit under diagnosis in the nonfaulty state and of function g(x) to the description of a faulty circuit. The homotopic path is used for monitoring the change of some element parameter pj from nominal to faulty value. In the presented method, the node homotopic paths are used for verification of fault hypotheses. The assumed hypothesis is true if different node homotopic paths hit the same end point. The essential feature of the method is the small number of hypothesis verifications. This method gives the possibility of fault localization as well as fault identification. The method is illustrated by the example of single-fault diagnosis of a one-stage transistor amplifier.
Keywords :
amplifiers; analogue circuits; circuit reliability; circuit testing; condition monitoring; fault diagnosis; piecewise linear techniques; transforms; PWL circuits; analog piecewise linear circuit fault diagnosis; bilinear transformation; element parameter change monitoring; fault hypotheses verification; fault identification; fault localization; faulty circuits; faulty element parameter value; function domains; homotopic parameters; homotopy mapping; node homotopic path end points; nonfaulty circuit state; one-stage transistor amplifier; single-fault diagnosis; verification methods; Circuit faults; Circuit testing; Condition monitoring; Equations; Fault diagnosis; Linear circuits; Nonlinear circuits; Piecewise linear techniques; Robots; Transistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2002.803515