• DocumentCode
    856537
  • Title

    A New Emittance Measuring Device of the Unilac

  • Author

    Strehl, P. ; Englert, G. ; Hartung, M. ; horneff, H.

  • Author_Institution
    GSI, Gesellschaft fÿr Schwerionenforschung mbH, Postfach 110541 6100 Darmstadt, Fed. Rep. of Germany
  • Volume
    28
  • Issue
    3
  • fYear
    1981
  • fDate
    6/1/1981 12:00:00 AM
  • Firstpage
    2216
  • Lastpage
    2218
  • Abstract
    For continuous monitoring of emittances and online calculation of beam envelopes during routine operation of the Unilac a fast measurement device was installed in the low energy beam transport line. Two orthogonal slit-collector systems are positioned parallel to the beam line. A microprocessor controlled electric deflecting system sweeps the beam by stepwise variation of the high voltage. The ratio between deflected and undeflected part of the pulsed beam can be varied within broad ranges. The minimum refresh rate for a complete emittance display in both transverse planes is 0.5 s. Although using fixed voltage steps the device can be adjusted to various charge to mass ratios. For comparison the slit-detector system can also be moved mechanically through the beam. Therefore the device combines a very fast nearly non-destructive emittance scan with a slow destructive system.
  • Keywords
    Circuits; Control systems; Displays; Energy measurement; Ion sources; Microprocessors; Monitoring; Resistors; Switches; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4331641
  • Filename
    4331641