DocumentCode
856537
Title
A New Emittance Measuring Device of the Unilac
Author
Strehl, P. ; Englert, G. ; Hartung, M. ; horneff, H.
Author_Institution
GSI, Gesellschaft fÿr Schwerionenforschung mbH, Postfach 110541 6100 Darmstadt, Fed. Rep. of Germany
Volume
28
Issue
3
fYear
1981
fDate
6/1/1981 12:00:00 AM
Firstpage
2216
Lastpage
2218
Abstract
For continuous monitoring of emittances and online calculation of beam envelopes during routine operation of the Unilac a fast measurement device was installed in the low energy beam transport line. Two orthogonal slit-collector systems are positioned parallel to the beam line. A microprocessor controlled electric deflecting system sweeps the beam by stepwise variation of the high voltage. The ratio between deflected and undeflected part of the pulsed beam can be varied within broad ranges. The minimum refresh rate for a complete emittance display in both transverse planes is 0.5 s. Although using fixed voltage steps the device can be adjusted to various charge to mass ratios. For comparison the slit-detector system can also be moved mechanically through the beam. Therefore the device combines a very fast nearly non-destructive emittance scan with a slow destructive system.
Keywords
Circuits; Control systems; Displays; Energy measurement; Ion sources; Microprocessors; Monitoring; Resistors; Switches; Voltage control;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4331641
Filename
4331641
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