• DocumentCode
    856721
  • Title

    [Advertisement]

  • Volume
    9
  • Issue
    5
  • fYear
    2008
  • Firstpage
    13
  • Lastpage
    13
  • Abstract
    Tired of endless iterations, tweaks, and redesign cycles? Wish you could modify or compact your layout and see the coupling effects on circuit performance instantaneously? With ACEtrade, AWR´s new automated circuit extraction technology, you can. ACE extracts layout-driven effects including coupling in multilayered RF modules and ICs - in seconds and stops the monotony of brute force EM analysis or schematic-driven manual fracturing techniques.
  • Keywords
    integrated circuit design; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; IC; automated circuit extraction technology; brute force EM analysis; circuit coupling effects; layout-driven effects; multilayered RF modules; schematic-driven manual fracturing techniques;
  • fLanguage
    English
  • Journal_Title
    Microwave Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1527-3342
  • Type

    jour

  • DOI
    10.1109/MMW.2008.4622324
  • Filename
    4622324