DocumentCode :
856781
Title :
Concerning reliability prediction
Author :
Combs, C.A., Jr. ; Wujek, J.H., Jr.
Volume :
51
Issue :
9
fYear :
1963
Firstpage :
1248
Lastpage :
1248
Keywords :
Art; Circuit optimization; Costs; Failure analysis; Frequency; Mathematical model; Semiconductor device reliability; State estimation; Statistical distributions; Varactors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1963.2513
Filename :
1444443
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=856781
