DocumentCode
856781
Title
Concerning reliability prediction
Author
Combs, C.A., Jr. ; Wujek, J.H., Jr.
Volume
51
Issue
9
fYear
1963
Firstpage
1248
Lastpage
1248
Keywords
Art; Circuit optimization; Costs; Failure analysis; Frequency; Mathematical model; Semiconductor device reliability; State estimation; Statistical distributions; Varactors;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1963.2513
Filename
1444443
Link To Document