• DocumentCode
    857025
  • Title

    Finite element methods for junctions of microwave and optical waveguides

  • Author

    Webb, J.P.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1754
  • Lastpage
    1758
  • Abstract
    It is noted that the finite-element method is capable of calculating the electromagnetic fields in many microwave and optical components and providing scattering matrices. Two approaches have been used: exciting the device with incident waves and calculating reflected waves; and exciting the device with applied voltages and calculating currents. It is pointed out that 3-D analysis is computationally expensive, but, fortunately, there are important classes of device amenable to analysis in 2-D. Optical components, which are usually unbounded, can be handled with the help of absorbing boundary conditions. Two examples are given: a rectangular-waveguide phase-shifter and a dielectric-waveguide transformer. It is concluded that developments such as automatic mesh generators, absorbing boundary conditions, and efficient sparse matrix techniques have made the finite-element method competitive with integral-equation approaches, and distinctly advantageous when there are several materials or complicated shapes to model
  • Keywords
    dielectric waveguides; finite element analysis; optical waveguide theory; absorbing boundary conditions; applied voltages; automatic mesh generators; dielectric-waveguide transformer; electromagnetic fields; finite-element method; incident waves; integral-equation approaches; junctions; microwave waveguides; optical components; optical waveguides; rectangular-waveguide phase-shifter; reflected waves; scattering matrices; sparse matrix techniques; Boundary conditions; Dielectrics; Electromagnetic fields; Electromagnetic scattering; Finite element methods; Microwave devices; Microwave theory and techniques; Optical devices; Optical scattering; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104514
  • Filename
    104514