Title :
Superconducting Nd/sub 1.85/Ce/sub 0.15/CuO/sub 4-y/ thin films and heterostructures on sapphire
Author :
Mao, S.N. ; Jian Mao ; Xi, X.X. ; Wu, D.H. ; Qi Li ; Anlage, S.M. ; Venkatesan, T. ; Wu, X.D.
Author_Institution :
Dept. of Phys., Maryland Univ., College Park, MD, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
Superconducting Nd/sub 1.85/Ce/sub 0.15/CuO/sub 4-y/ (NCCO) thin films have been made on yttria-stabilized zirconia (YSZ) buffered sapphire. The films are epitaxially grown and highly in-plane oriented. X-ray diffraction shows the c-axis of the film normal to the surface of the substrate. The width of rocking curve is 0.2/spl deg/ and the RBS channeling yield is 9%, indicating high crystallinity of the film. Cross-sectional transmission electron microscopy images reveal a sharp interface between NCCO and YSZ. The microwave surface resistance of NCCO films on YSZ buffered sapphire at 9.6 GHz was measured and a value of 80 /spl mu//spl Omega/ (at 4.2 K in zero DC magnetic field) was obtained, which is comparable to Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-y/ (YBCO) films at the same reduced temperature. A trilayer structure of YBCO/SrTiO/sub 3//NCCO on YSZ buffered sapphire has been fabricated with all layers oriented, in which both the YBCO and NCCO layers are superconducting.<>
Keywords :
Rutherford backscattering; X-ray diffraction; cerium compounds; channelling; high-frequency effects; high-temperature superconductors; neodymium compounds; pulsed laser deposition; superconducting epitaxial layers; superconducting junction devices; superconducting microwave devices; superconducting superlattices; surface conductivity; transmission electron microscopy; vapour phase epitaxial growth; 4.2 K; 80 muohm; 9.6 GHz; Al/sub 2/O/sub 3/; Nd/sub 1.85/Ce/sub 0.15/CuO/sub 4-y/ thin films; Nd/sub 1.85/Ce/sub 0.15/CuO/sub 4/-Al/sub 2/O/sub 3/; RBS channeling yield; X-ray diffraction; Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-y/ films; YBa/sub 2/Cu/sub 3/O/sub 7/; cross-sectional transmission electron microscopy; epitaxially grown film; high crystallinity; high temperature superconductors; microwave surface resistance; rocking curve width; sharp interface; superconducting heterostructures; superconducting thin films; trilayer structure; yttria-stabilized zirconia buffered sapphire; zero DC magnetic field; Magnetic field measurement; Magnetic films; Neodymium; Superconducting epitaxial layers; Superconducting films; Superconducting microwave devices; Superconducting thin films; Surface resistance; X-ray imaging; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
