• DocumentCode
    857494
  • Title

    Comparison of optical losses in dielectric-apertured vertical-cavity lasers

  • Author

    Floyd, P.D. ; Thibeault, B.J. ; Hegblom, E.R. ; Ko, J. ; Coldren, L.A. ; Merz, J.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    8
  • Issue
    5
  • fYear
    1996
  • fDate
    5/1/1996 12:00:00 AM
  • Firstpage
    590
  • Lastpage
    592
  • Abstract
    The performance of vertical-cavity lasers (VCL´s) employing dielectric apertures formed by lateral oxidation or wet-etch undercutting of an AlAs layer on a common substrate are compared. Although both device types performed well, extracted optical losses from the wet-etch undercut structures exceed those of AlAs-oxide apertured lasers. The difference in performance is attributed to optical scattering losses specific to the aperture fabrication method, enhanced by loss from the larger index of refraction discontinuity of the air-gap aperture relative to the AlAs-oxide aperture.
  • Keywords
    distributed Bragg reflector lasers; etching; laser cavity resonators; light scattering; optical losses; oxidation; quantum well lasers; Al/sub 0.5/Ga/sub 0.5/As; AlAs; AlAs layer; AlAs-oxide apertured lasers; GaAs-Al/sub 0.67/Ga/sub 0.33/:Be; In/sub 0.17/Ga/sub 0.83/As; air-gap aperture; aperture fabrication method; dielectric-apertured vertical-cavity lasers; index of refraction discontinuity; lateral oxidation; optical scattering losses; performance; wet-etch undercut structures; wet-etch undercutting; Apertures; Dielectric losses; Dielectric substrates; Optical devices; Optical losses; Optical refraction; Optical scattering; Oxidation; Performance loss; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.491548
  • Filename
    491548