• DocumentCode
    857504
  • Title

    Measurement of intrinsic frequency response of semiconductor lasers using optical modulation

  • Author

    Lange, C.H. ; Eom, J. ; Su, C.B. ; Schlafer, J. ; Lauer, R.B.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX
  • Volume
    24
  • Issue
    18
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    1131
  • Lastpage
    1132
  • Abstract
    For the first time, optical modulation is used to determine the intrinsic frequency response of a laser diode. It is shown that the shape of the measured frequency response agrees very well with the predicted intrinsic response of semiconductor laser. As anticipated, the measured frequency response lacks the frequency rolloff that occurs with direct RF current modulation. The resonant frequencies measured are shown to be proportional to the square root of the probe laser bias power and the damping rates are found to be linear in power, in agreement with expectations
  • Keywords
    frequency response; laser variables measurement; optical modulation; semiconductor junction lasers; damping rates; intrinsic frequency response; laser diode; optical modulation; probe laser bias power; resonant frequencies; semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    19587