• DocumentCode
    857517
  • Title

    Low-frequency noise and Hall effect measurements on YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films

  • Author

    Jahanzeb, A. ; Celik-Butler, Z.

  • Author_Institution
    Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1416
  • Lastpage
    1419
  • Abstract
    We report 1/f noise and Hall effect measurements performed on c-axis oriented YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films at superconducting transition and in normal state. Magnetic fields up to 6 kG were applied parallel to c-axis. The voltage noise spectral density was normalized using Hall carrier density as well as atomic concentration. Close to the superconductive state, normalized voltage noise spectral density had a sharp rise. The noise did not seem to originate from local thermal fluctuations. We interpreted the data in terms of the classic percolation model near superconductive transition, according to which normalized noise is proportional to R/sup -k´/s/, where R is the macroscopic sample resistance and k´ and s are critical exponents. The ratio k´/s, which can be regarded as an index of the rise of normalized noise, steadily increased with higher magnetic field. The zero-Gauss value of k´/s was calculated as 1.06; a result that agrees with the prediction of the classical percolation theory for a 2-D network.<>
  • Keywords
    1/f noise; Hall effect; barium compounds; critical current density (superconductivity); fluctuations in superconductors; high-temperature superconductors; superconducting device noise; superconducting thin films; superconducting transition temperature; yttrium compounds; 1/f noise; 2-D network; 6 kG; Hall carrier density; Hall effect measurements; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films; YBa/sub 2/Cu/sub 3/O/sub 7/; atomic concentration; classic percolation model; high temperature superconductor; local thermal fluctuations; low-frequency noise; macroscopic sample resistance; normal state; normalized voltage noise spectral density; superconducting transition; voltage noise spectral density; zero-Gauss value; Hall effect; Low-frequency noise; Magnetic field measurement; Magnetic noise; Noise measurement; Performance evaluation; Superconducting device noise; Superconducting thin films; Superconductivity; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402830
  • Filename
    402830