Title :
The perfectly matched layer boundary condition for modal analysis of optical waveguides: leaky mode calculations
Author :
Huang, W.-P. ; Xu, C.L. ; Lui, W. ; Yokoyama, K.
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
fDate :
5/1/1996 12:00:00 AM
Abstract :
The perfectly matched layer (PML) boundary condition is applied to modal analysis for optical waveguides. It is demonstrated that the PML is suitable and effective in computation of leaky modes.
Keywords :
eigenvalues and eigenfunctions; finite difference methods; optical waveguide theory; leaky mode calculations; leaky modes; modal analysis; optical waveguides; perfectly matched layer boundary condition; Boundary conditions; Conductivity; Finite difference methods; Modal analysis; Optical refraction; Optical variables control; Optical waveguides; Perfectly matched layers; Refractive index; Silicon;
Journal_Title :
Photonics Technology Letters, IEEE
