Title :
Effects of the flux creep and pinning energies on the critical current density of high quality Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ epitaxial films
Author :
Alvarez, G.A. ; Koyanagi, M. ; Yamasaki, H. ; Matsuda, M.
Author_Institution :
Electrotech. Lab., Tsukuba, Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
Epitaxial Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ (YBCO) films with very smooth surface morphology and excellent electrical properties (T/sub c/=92 K, J/sub c/=10/sup 7/ A/cm/sup 2/) were grown on.<>
Keywords :
atomic force microscopy; barium compounds; critical current density (superconductivity); flux creep; flux pinning; high-temperature superconductors; scanning electron microscopy; superconducting epitaxial layers; superconducting microbridges; superconducting transition temperature; surface topography; yttrium compounds; 0 to 14 T; 92 K; Y/sub 1/Ba/sub 2/Cu/sub 3/O; Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ epitaxial films; atomic force microscopy; critical current density; electrical properties; epitaxial grains; flux creep; flux pinning energy; high resolution SEM; magnetic field dependence; nonepitaxial grains; patterned microbridges; pulsed laser deposition; smooth surface morphology; temperature dependence; Atomic force microscopy; Creep; Critical current density; Current measurement; Magnetic field measurement; Magnetic films; Plasma temperature; Substrates; Surface morphology; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
