Effects of the flux creep and pinning energies on the critical current density of high quality Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ epitaxial films

Author

Alvarez, G.A. ; Koyanagi, M. ; Yamasaki, H. ; Matsuda, M.

Author_Institution

Electrotech. Lab., Tsukuba, Japan

Volume

5

Issue

2

fYear

1995

fDate

6/1/1995 12:00:00 AM

Firstpage

1533

Lastpage

1536

Abstract

Epitaxial Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ (YBCO) films with very smooth surface morphology and excellent electrical properties (T/sub c/=92 K, J/sub c/=10/sup 7/ A/cm/sup 2/) were grown on.<>

Keywords

atomic force microscopy; barium compounds; critical current density (superconductivity); flux creep; flux pinning; high-temperature superconductors; scanning electron microscopy; superconducting epitaxial layers; superconducting microbridges; superconducting transition temperature; surface topography; yttrium compounds; 0 to 14 T; 92 K; Y/sub 1/Ba/sub 2/Cu/sub 3/O; Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub x/ epitaxial films; atomic force microscopy; critical current density; electrical properties; epitaxial grains; flux creep; flux pinning energy; high resolution SEM; magnetic field dependence; nonepitaxial grains; patterned microbridges; pulsed laser deposition; smooth surface morphology; temperature dependence; Atomic force microscopy; Creep; Critical current density; Current measurement; Magnetic field measurement; Magnetic films; Plasma temperature; Substrates; Surface morphology; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.402864

Filename

402864