DocumentCode :
85789
Title :
Increasing Endurance and Security of Phase-Change Memory with Multi-Way Wear-Leveling
Author :
Hongliang Yu ; Yuyang Du
Author_Institution :
Comput. Sci. Dept., Tsinghua Univ., Beijing, China
Volume :
63
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
1157
Lastpage :
1168
Abstract :
Phase-change memory (PCM) is a promising alternative of DRAM. Nonetheless, it has a well-known problem that is the limited number of writes to storage cells. Thus, wear-leveling, which makes the writes uniform, is crucial to boost PCM´s lifetime. This paper proposes multi-way wear leveling (MWWL) to increase both endurance and security of PCM. MWWL can efficiently distribute writes to physical addresses uniformly from a multiple of ways while incurring little write overhead and almost no extra hardware overhead. More important, MWWL is a fundamental scheme that can be applied to existing leveling algorithms. As a case study, we extended a state-of-the-art technique, Security Refresh, to its multi-way version, Multi-Way Security Refresh (MWSR). The experimental results show that MWSR can achieve the same or better lifetime than that of the original two-level Security Refresh but with much less write overhead (from 11.7% down to 1.5%).
Keywords :
DRAM chips; phase change memories; security of data; DRAM; MWSR; MWWL; PCM endurance; PCM lifetime; PCM security; leveling algorithms; multiway security refresh; multiway version; multiway wear leveling; phase change memory; storage cells; Ash; Hardware; Phase change materials; Phase change memory; Random access memory; Scalability; Security; Phase-change memory; endurance; lifetime; security; wear-leveling; write overhead;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2012.292
Filename :
6375706
Link To Document :
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