DocumentCode :
858410
Title :
Improvement on Defect Detection Performance of PCB Inspection Based on ECT Technique With Multi-SV-GMR Sensor
Author :
Chomsuwan, K. ; Yamada, S. ; Iwahara, M.
Author_Institution :
Inst. of Nature & Environ. Technol., Kanazawa Univ., Ishikawa
Volume :
43
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
2394
Lastpage :
2396
Abstract :
This paper describes the improvement on the defect detection performance of printed circuit board (PCB) inspection based on the eddy-current testing (ECT) technique with the multispin-valve giant magnetoresistance (SV-GMR) sensor. To obtain the ECT signal in the same scanning line, SV-GMR sensors are mounted on the exciting coil in the same column parallel with the scanning direction. Harmonic analysis based on the Fourier transform is used to analyze the signal from the SV-GMR sensor in order to increase scanning speed. Then signal averaging is applied to the ECT signal in order to improve the signal-to-noise ratio. Experimental results are performed to verify the inspection performance
Keywords :
Fourier analysis; eddy current testing; flaw detection; giant magnetoresistance; harmonic analysis; magnetic noise; magnetic sensors; printed circuits; spin valves; ECT technique; Fourier transform harmonic analysis; PCB inspection; defect detection; eddy current testing; exciting coils; multi SV GMR sensors; multi spin valve giant magnetoresistance sensors; printed circuit board; signal-noise ratio; Circuit testing; Coils; Electrical capacitance tomography; Fourier transforms; Giant magnetoresistance; Harmonic analysis; Inspection; Magnetic sensors; Printed circuits; Sensor phenomena and characterization; Eddy-current testing (ECT); multisensor; printed circuit board (PCB); scanning speed; signal averaging; signal-to-noise ratio (SNR); spin-valve giant magnetoresistance (SV-GMR);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2007.893480
Filename :
4202678
Link To Document :
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