• DocumentCode
    858423
  • Title

    A layout structure for matching many integrated resistors

  • Author

    Van der Wagt, J. Paul A ; Chu, Gordon G. ; Conrad, Christine L.

  • Author_Institution
    Rockwell Sci. Corp., Thousand Oaks, CA, USA
  • Volume
    51
  • Issue
    1
  • fYear
    2004
  • Firstpage
    186
  • Lastpage
    190
  • Abstract
    A proposed mirrored shuffle layout pattern cancels systematic resistor gradient variations up to second order and allows monolithic integration of hundreds of matched resistors for precision analog circuits. A test circuit uses 15 000 subresistors and three levels of interconnect to form 150 main resistors in a 2.85×0.83 mm2 area. It demonstrates better than 11-b matching. The dominant remaining error is related to a layout artifact external to the core resistor array, and after separation the resistor array itself achieves over 13-b matching. Wafer maps show significant first- and second-order resistor value gradients that are cancelled to within the measurement error.
  • Keywords
    VLSI; analogue integrated circuits; analogue-digital conversion; digital-analogue conversion; integrated circuit layout; measurement errors; resistors; ADC; DAC; automated test; integrated circuit layout; layout artifact; layout structure; many integrated resistors matching; mirrored shuffle layout pattern; monolithic integration; passive circuits; precision analog circuits; systematic resistor gradient variations; wafer maps; Analog integrated circuits; Area measurement; Bipolar transistors; Circuit testing; Digital integrated circuits; Digital-analog conversion; Integrated circuit layout; Resistors; Thermal stresses; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2003.821303
  • Filename
    1259502