DocumentCode :
858434
Title :
A gradient-error and edge-effect tolerant switching scheme for a high-accuracy DAC
Author :
Deveugele, Jurgen ; Van der Plas, G. ; Steyaert, Michiel ; Gielen, Georges ; Sansen, Willy
Author_Institution :
Dept. of Elektrotechniek, Katholieke Univ. Leuven, Heverlee, Belgium
Volume :
51
Issue :
1
fYear :
2004
Firstpage :
191
Lastpage :
195
Abstract :
This brief analyzes the systematic errors that limit the intrinsic accuracy of a digital-to-analog converter (DAC). A new switching scheme is proposed that exhibits special properties: it cancels the linear and quadratic gradient errors at the MSB level. We explain why this scheme has those properties and how to construct it. This scheme excels at reducing edge-effects occurring at the side of the array. No extracted information from the error profile is required. This increases the robustness of the scheme and reduces the need for reprocessing. The effectiveness of this scheme is demonstrated by applying it to the measured error profile of a 14-b current-steering converter without dummies. This shows that 14-b current-steering converters can be constructed without any dummy rows or columns at all.
Keywords :
CMOS integrated circuits; coding errors; digital-analogue conversion; error compensation; measurement errors; switched current circuits; CMOS technology; current-steering converter; edge-effect tolerant switching; gradient-error tolerant switching; high-accuracy DAC; intrinsic accuracy; linear gradient errors; quadratic gradient errors; switching sequence; systematic errors; unary source; virtual quadrant; Current measurement; Data mining; Decoding; Digital-analog conversion; Error analysis; Programmable logic arrays; Robustness; Semiconductor device measurement; Switching converters; Temperature;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2003.821307
Filename :
1259503
Link To Document :
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