• DocumentCode
    858702
  • Title

    Microwave dissipation due to vortices in YBa/sub 2/Cu/sub 3/O/sub 7-x/ thin films for magnetic fields applied at small angles from the ab-planes

  • Author

    Anand, N. ; Itzler, M.A. ; Tinkham, M.

  • Author_Institution
    Dept. of Phys., Harvard Univ., Cambridge, MA, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1671
  • Lastpage
    1674
  • Abstract
    YBa/sub 2/Cu/sub 3/O/sub 7-x/ thin films patterned in a meander line resonant structure are used to probe vortex dynamics at microwave frequencies. We perform highly sensitive measurements of the changes in surface resistance /spl Delta/R/sub s/(H,T,/spl theta/) of YBa/sub 2/Cu/sub 3/O/sub 7-x/ thin films as a function of applied dc field, temperature, and angle of the applied field relative to the ab-planes. We observe that the component of the magnetic field normal to the planes produces substantially more dissipation than the component parallel to the planes. Also, the surface resistance R/sub s/ vs. H data for magnetic fields applied at small angles from the ab-planes shows two regions of markedly different field dependence separated by a crossover field H*. For applied fields H>H* we have linear dependence of R/sub s/ on applied field with a steep slope. For applied fields H>
  • Keywords
    Meissner effect; barium compounds; flux-line lattice; high field effects; high-temperature superconductors; superconducting thin films; surface conductivity; yttrium compounds; YBa/sub 2/Cu/sub 3/O/sub 7/; applied DC field; high temperature superconductor; meander line resonant structure; microwave dissipation; surface resistance; thin films; transverse Meissner effect; vortex dynamics; Electrical resistance measurement; Magnetic field measurement; Magnetic fields; Microwave frequencies; Performance evaluation; Probes; Resonance; Surface resistance; Temperature sensors; Transistors;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402897
  • Filename
    402897