DocumentCode :
858905
Title :
State-of-the-art in integrated optical microspectrometers
Author :
Wolffenbuttel, Reinoud F.
Author_Institution :
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
Volume :
53
Issue :
1
fYear :
2004
Firstpage :
197
Lastpage :
202
Abstract :
Microspectrometers fabricated in silicon using microelectromechanical systems technologies are versatile microinstruments: small, lightweight, and featuring a demonstrated capability for spectral analysis. When realized using silicon process compatible technologies, low-cost batch fabrication of an intelligent optoelectronic system-on-a-chip is feasible by cointegration of optics with microelectronic circuits. However, the spectral resolution of devices presented so far has been limited to about R=15, which does restrict application. This paper provides an overview of microspectrometers operating in the visible and infrared spectral range. Moreover, it is demonstrated that the resolution is primarily limited due to the short optical path that is inherent to a microsystem, optical properties of silicon IC-process compatible materials, and lack of adequate optical signal conditioning.
Keywords :
infrared spectrometers; interference spectrometers; micro-optics; micromachining; optical planar waveguides; reviews; visible spectrometers; Fabry-Perot interferometer; MEMS; infrared spectrometer; integrated optical microspectrometers; intelligent optoelectronic system-on-a-chip; low-cost batch fabrication; micromachining; miniaturized spectrometer; optical sensor; planar waveguide-based grating spectrometer; short optical path; silicon process compatible technologies; spectral resolution; visible spectrometer; Infrared spectra; Integrated circuit technology; Integrated optics; Intelligent systems; Microelectromechanical systems; Microelectronics; Optical device fabrication; Silicon; Spectral analysis; System-on-a-chip;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.821490
Filename :
1259546
Link To Document :
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