• DocumentCode
    858905
  • Title

    State-of-the-art in integrated optical microspectrometers

  • Author

    Wolffenbuttel, Reinoud F.

  • Author_Institution
    Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
  • Volume
    53
  • Issue
    1
  • fYear
    2004
  • Firstpage
    197
  • Lastpage
    202
  • Abstract
    Microspectrometers fabricated in silicon using microelectromechanical systems technologies are versatile microinstruments: small, lightweight, and featuring a demonstrated capability for spectral analysis. When realized using silicon process compatible technologies, low-cost batch fabrication of an intelligent optoelectronic system-on-a-chip is feasible by cointegration of optics with microelectronic circuits. However, the spectral resolution of devices presented so far has been limited to about R=15, which does restrict application. This paper provides an overview of microspectrometers operating in the visible and infrared spectral range. Moreover, it is demonstrated that the resolution is primarily limited due to the short optical path that is inherent to a microsystem, optical properties of silicon IC-process compatible materials, and lack of adequate optical signal conditioning.
  • Keywords
    infrared spectrometers; interference spectrometers; micro-optics; micromachining; optical planar waveguides; reviews; visible spectrometers; Fabry-Perot interferometer; MEMS; infrared spectrometer; integrated optical microspectrometers; intelligent optoelectronic system-on-a-chip; low-cost batch fabrication; micromachining; miniaturized spectrometer; optical sensor; planar waveguide-based grating spectrometer; short optical path; silicon process compatible technologies; spectral resolution; visible spectrometer; Infrared spectra; Integrated circuit technology; Integrated optics; Intelligent systems; Microelectromechanical systems; Microelectronics; Optical device fabrication; Silicon; Spectral analysis; System-on-a-chip;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.821490
  • Filename
    1259546