DocumentCode
858964
Title
Integrated On-Chip Inductors With Magnetic Films
Author
Gardner, Donald S. ; Schrom, Gerhard ; Hazucha, Peter ; Paillet, Fabrice ; Karnik, Tanay ; Borkar, Shekhar
Author_Institution
Circuits Res., Intel Labs, Santa Clara, CA
Volume
43
Issue
6
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
2615
Lastpage
2617
Abstract
On-chip inductors with 2 levels of magnetic material were integrated into an advanced 130-nm CMOS process to obtain over an order of magnitude increase in inductance (19times) and Q-factor (16times), significantly greater than prior values of les2.3times for high frequency inductors. The magnetic material enhances inductance at frequencies up to 9.8 GHz. Measurements and models of the permeability from amorphous CoZrTa alloy demonstrate that the skin effect and eddy current dampening become important. Two levels of magnetic material with high-temperature and long annealing-time stability, high saturation magnetization, low magnetostriction, high resistivity, minimal hysteretic loss, and compatibility with Si technology were used in combination with magnetic vias and elongated structures that take advantage of the uniaxial magnetic anisotropy
Keywords
CMOS integrated circuits; eddy current losses; inductors; magnetic anisotropy; magnetic thin films; magnetostriction; CMOS process; eddy current dampening; high-frequency inductors; hysteretic loss; integrated onchip inductors; magnetic anisotropy; magnetic films; magnetic materials; magnetostriction; saturation magnetization; CMOS process; Frequency; Inductance; Inductors; Magnetic anisotropy; Magnetic films; Magnetic materials; Magnetostriction; Q factor; Saturation magnetization; Amorphous magnetic films; high-frequency permeability; soft magnetic materials; thin film inductors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2007.893794
Filename
4202728
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