• DocumentCode
    859085
  • Title

    Fast simulation of multistage power electronic systems with widely separated operating frequencies

  • Author

    Fung, K.K. ; Hui, S.Y.R.

  • Author_Institution
    Sch. of Electr. Eng., Univ. of Technol., Sydney, NSW, Australia
  • Volume
    11
  • Issue
    3
  • fYear
    1996
  • fDate
    5/1/1996 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    412
  • Abstract
    This paper presents a fast and efficient way of simulating multistage power electronic circuits with different stages operating at widely separated frequencies, using the transmission-line modeling (TLM) technique. A multistage circuit can be modeled as several smaller subcircuits, which can then be simulated individually with different time steps according to their circuit time constants. Energy exchange between linked subcircuits are made possible via the use of a new TLM stub link conversion technique and improved TLM link algorithms. The proposed technique has been tested successfully in a simulation of a switched-mode power supply. Simulation results confirm that the new approach can greatly reduce the computing time of the simulation when compared with conventional TLM simulation methods. A reduction of about two-thirds of the computing time has been achieved in the simulation of a three-stage switched-mode power supply
  • Keywords
    circuit analysis computing; digital simulation; switched mode power supplies; transmission line theory; 3-stage switched-mode power supply; TLM link algorithms; TLM stub link conversion technique; circuit time constants; energy exchange; fast simulation; linked subcircuits; multistage power electronic systems; separated operating frequencies; transmission-line modeling technique; Circuit simulation; Computational modeling; DC-DC power converters; Diodes; Energy exchange; Frequency; Power electronics; Power system modeling; Rectifiers; Switched-mode power supply;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/63.491633
  • Filename
    491633