DocumentCode :
859260
Title :
A formal analysis of the subsume relation between software test adequacy criteria
Author :
Zhu, Hong
Author_Institution :
Inst. of Comput. Software, Nanjing Univ., China
Volume :
22
Issue :
4
fYear :
1996
fDate :
4/1/1996 12:00:00 AM
Firstpage :
248
Lastpage :
255
Abstract :
Software test adequacy criteria are rules to determine whether a software system has been adequately tested. A central question in the study of test adequacy criteria is how they relate to fault detecting ability. We identify two idealized software testing scenarios. In the first scenario, which we call prior testing scenario, software testers are provided with an adequacy criterion in addition to the software under test. The knowledge of the adequacy criterion is used to generate test cases. In the second scenario, which we call posterior testing scenario, software testers are not provided with the knowledge of adequacy criterion. The criterion is only used to decide when to stop the generation of test cases. In 1993, Frankl and Weyuker proved that the subsume relation between software test adequacy criteria does not guarantee better fault detecting ability in the prior testing scenario. We investigate the posterior testing scenario and prove that in this scenario the subsume relation does guarantee a better fault detecting ability. Two measures of fault detecting ability will be used, the probability of detecting faults and the expected number of exposed errors
Keywords :
probability; program diagnostics; program testing; expected exposed errors; fault detecting ability; fault detection probability; formal analysis; idealized software testing scenarios; posterior testing scenario; prior testing scenario; software system; software test adequacy criteria; software testers; subsume relation; test case generation; Fault detection; Genetic mutations; Linear code; Software measurement; Software systems; Software testing; System testing;
fLanguage :
English
Journal_Title :
Software Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-5589
Type :
jour
DOI :
10.1109/32.491648
Filename :
491648
Link To Document :
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