• DocumentCode
    859309
  • Title

    Anisotropic flux pinning in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// single crystals

  • Author

    Pan, V.M. ; Solovjov, V.F. ; Svetchnikov, V.L. ; Freyhardt, H.C.

  • Author_Institution
    Inst. for Metal Phys., Kiev, Ukraine
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1892
  • Lastpage
    1895
  • Abstract
    Direct transport measurements of the critical currents as well as their angular and field dependencies in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// single crystals were performed. The role of twin planes as extended defects, which provide a vortex locking, is studied and their contribution to the J/sub c/ anisotropy is analyzed. The angular dependence of the critical current is represented as a combination of a contribution from extended defects and a point-like-defect-induced anisotropic background. The latter is responsible for the major part of the measured J/sub c/ anisotropy. The observed Kramer-like scaling law concerning the dependencies of the volume pinning force versus the applied magnetic field component along the c-axis indicates a three-dimensional flux line lattice behavior and excludes vortex decoupling as a possible mechanism of the "fishtail-effect".<>
  • Keywords
    barium compounds; critical current density (superconductivity); flux pinning; high-temperature superconductors; twin boundaries; yttrium compounds; 3D flux line lattice; Kramer-like scaling law; YBa/sub 2/Cu/sub 3/O/sub 7/; angular dependence; anisotropic flux pinning; critical currents; extended defects; fishtail-effect; high temperature superconductor; single crystals; twin planes; volume pinning force; vortex locking; Anisotropic magnetoresistance; Critical current; Crystallization; Crystals; Flux pinning; Lattices; Magnetic field measurement; Physics; Temperature dependence; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402951
  • Filename
    402951