• DocumentCode
    859579
  • Title

    A transparent online memory test for simultaneous detection of functional faults and soft errors in memories

  • Author

    Thaller, Karl ; Steininger, Andreas

  • Author_Institution
    Decomsys, Vienna, Austria
  • Volume
    52
  • Issue
    4
  • fYear
    2003
  • Firstpage
    413
  • Lastpage
    422
  • Abstract
    The Transparent Online Memory Test (TOMT) introduced here has been specifically developed for online testing of word-oriented memories with parity or Hamming protection. Careful interleaving of a word-oriented and a bit-oriented test facilitates a fault coverage and a test duration comparable to the widely used March C- algorithm. Unlike similar methods TOMT actively exercises all bit cells in memory within one test period. Hence it not only detects soft errors but also functional faults and reliably prevents fault accumulation. Different variants of the basic TOMT algorithm are investigated in terms of fault coverage and test time. A prototype implementation for SRAM is introduced which-integrated into a standard processor/memory interface-autonomously performs the transparent online memory test. The trade-offs in terms of hardware overhead and memory access delay caused by this system integration are explored.
  • Keywords
    Hamming codes; SRAM chips; built-in self test; data integrity; error correction; error detection; fault diagnosis; fault tolerant computing; parity check codes; Hamming protection; March C- algorithm; SRAM; TOMT algorithm; address decoder fault; bit-oriented test facilitates; built-in-self test; coupling fault; fault accumulation; fault coverage; functional faults; hardware overhead; memory access delay; memory interface; soft error detection; system integration; transparent online memory test; word-oriented memories; Automatic testing; Built-in self-test; Circuit faults; Computer errors; Decoding; Error correction; Fault detection; Protection; Random access memory; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2003.821927
  • Filename
    1260592