DocumentCode :
859638
Title :
High J/sub c/ YBCO thick films prepared by LPE method
Author :
Hirabayashi, I. ; Yoshida, M. ; Kitamura, T. ; Hyun, O.-B. ; Shiohara, Y. ; Tanaka, S. ; Tsuzuki, A. ; Sugawara, Y. ; Ikuhara, Y.
Author_Institution :
Supercond. Res. Lab., ISTEC, Tokyo, Japan
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
2015
Lastpage :
2018
Abstract :
High-J/sub c/ YBa/sub 2/Cu/sub 3/O/sub y/ thick films were prepared by the liquid phase epitaxy (LPE) method. The growth rate was typically about 2 /spl mu/m/min, which was 10-10/sup 2/ times larger than that by conventional vapor growth techniques. The T/sub c/ of the best film exceeded 88 K after oxygen annealing, and the transport zero-field J/sub c/ was over 10/sup 5/ A/cm/sup 2/ at 77 K. The peak effect in J/sub c/-B characteristics was observed at several tesla by magnetic and transport measurements. Based on the micro-structure, the relevant peak effect is considered to be caused by stacking faults which act as a field induced pinning center.<>
Keywords :
annealing; barium compounds; critical current density (superconductivity); crystal microstructure; flux pinning; high-temperature superconductors; liquid phase epitaxial growth; stacking faults; superconducting epitaxial layers; superconducting transition temperature; thick films; yttrium compounds; 77 K; 88 K; LPE method; O annealing; YBa/sub 2/Cu/sub 3/O; YBa/sub 2/Cu/sub 3/O/sub y/ thick films; critical current density; field induced pinning center; growth rate; high J/sub c/ thick films; high temperature superconductors; liquid phase epitaxy; magnetic measurements; microstructure; peak effect; stacking faults; superconducting transition temperature; transport measurements; transport zero-field; Atomic force microscopy; Magnetic films; Optical films; Optical microscopy; Scanning electron microscopy; Substrates; Superconducting films; Thick films; Transmission electron microscopy; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.402982
Filename :
402982
Link To Document :
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