DocumentCode :
859658
Title :
Designing fault-secure parallel encoders for systematic linear error correcting codes
Author :
Piestrak, Stanislaw J. ; Dandache, Abbas ; Monteiro, Fabrice
Author_Institution :
Inst. of Eng. Cybern., Wroclaw Univ., Poland
Volume :
52
Issue :
4
fYear :
2003
Firstpage :
492
Lastpage :
500
Abstract :
We consider the open problem of designing fault-secure parallel encoders for various systematic linear ECC. The main idea relies on generating not only the check bits for error correction but also, separately and in parallel, the check bits for error detection. Then, the latter are compared against error detecting check bits which are regenerated from the error correcting check bits. The detailed design is presented for encoders for CRC codes. The complexity evaluation of FPGA implementations of encoders with various degrees of parallelism shows that their fault-secure versions compare favorably against their unprotected counterparts both with respect to complexity and the maximal frequency of operation. Future research will include the design of FS decoders for CRC codes as well as the generalization of the presented ideas to design of FS encoders and decoders for other systematic linear ECC like nonbinary BCH codes and Reed-Solomon codes.
Keywords :
circuit complexity; cyclic redundancy check codes; error correction codes; error detection codes; fault tolerance; field programmable gate arrays; linear codes; parallel architectures; parity check codes; CRC code; FPGA implementation complexity; Reed-Solomon code; error correction; error detecting check bits; fault-secure decoders; fault-secure parallel encoder designing; fault-tolerance; linear feedback shift register; maximal operation frequency; nonbinary BCH code; self-checking circuit; systematic linear error correcting code; Circuit faults; Decoding; Electrical fault detection; Error correction; Error correction codes; Fault detection; Fault tolerant systems; Field programmable gate arrays; Parallel processing; Very large scale integration;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2003.821940
Filename :
1260599
Link To Document :
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